ETANI ELECTRONICS CO., LTD.

S-280 T/S Parameter Analyzer

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Contactless measurement using a laser displacement sensor, enabling you to observe the non-linearity of Thiele/Small parameters and input variation parameters of a single loudspeaker.

S-280 FEATURES

  • Thiele/Small parameters can be measured in a non-contact way without adding mass or stiffness.
  • Non-linearity due to amplitude can be observed by measuring Thiele/Small parameters with DC bias displacement.
  • The non-linearity of displacement due to input variation, can be verified by measuring the hysteresis curve.

S-280 MEASUREMENT CAPABILITY

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